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ORCIDJournal of Electronic Testing, Volume 38
Volume 38, Number 1, February 2022
- Vishwani D. Agrawal:
Editorial. 1-2 - New Editors - 2022. 3-4
- 2021 Reviewers. 5-6
- Test Technology Newsletter. 7-8
- Naveenkumar R
, N. M. Sivamangai, Napolean A, G. Akashraj Nissi:
Hardware Obfuscation for IP Protection of DSP Applications. 9-20 - Yujie Zhao, Kentaroh Katoh, Anna Kuwana, Shogo Katayama, Jianglin Wei, Haruo Kobayashi, Takayuki Nakatani, Kazumi Hatayama, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa:
Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies. 21-38 - Dengli Bu, Junjie Yan, Pengjie Tang, Haohao Yuan:
Synthesis of Reversible Circuits with Reduced Nearest-Neighbor Cost Using Kronecker Functional Decision Diagrams. 39-62 - Yingchun Lu, Guangzhen Hu, Jianan Wang, Hao Wang, Liang Yao, Huaguo Liang, Maoxiang Yi, Zhengfeng Huang:
A Low Power-Consumption Triple-Node-Upset-Tolerant Latch Design. 63-76 - Yingchun Xiao, Feng Zhu, Shengxian Zhuang, Yang Yang:
A New Neural Network Based on CNN for EMIS Identification. 77-89 - Abhishek Bhattacharjee, Abhishek Nag, Kaushik Das, Sambhu Nath Pradhan:
Design of Power Gated SRAM Cell for Reducing the NBTI Effect and Leakage Power Dissipation During the Hold Operation. 91-105 - Ahmad Menbari, Hadi Jahanirad:
A Low-cost BIST Design Supporting Offline and Online Tests. 107-123
Volume 38, Number 2, April 2022
- Vishwani D. Agrawal:
Editorial. 125-126 - Stefano Di Carlo:
Test Technology Newsletter. 127-129 - Ishak Parlar, Mehmet Nuri Almali:
Comparison of the Output Parameters of the Memristor-based Op-amp Model and the Traditional Op-amp Model. 131-143 - Dev Narayan Yadav, Phrangboklang Lyngton Thangkhiew, Kamalika Datta, Sandip Chakraborty, Rolf Drechsler, Indranil Sengupta:
FAMCroNA: Fault Analysis in Memristive Crossbars for Neuromorphic Applications. 145-163 - Shuo Cai, Binyong He, Sicheng Wu, Jin Wang, Weizheng Wang, Fei Yu:
An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation. 165-180 - N. Siva Balan, B. S. Murugan:
Low Area FPGA Implementation of AES Architecture with EPRNG for IoT Application. 181-193 - Huajie Huang, Junjie Dai, Long Dou, Junfu Liu, Yunpeng Liu, Taotao Chen, Tianxiang Wu, Junhui Li:
Research on the Mechanical Properties of Magnetorheological Damping and the Performance of Microprobe Test Process. 195-203 - Bahman Arasteh, Seyed Mohammad Javad Hosseini:
Traxtor: An Automatic Software Test Suit Generation Method Inspired by Imperialist Competitive Optimization Algorithms. 205-215 - Shravani Chandaka, Balaji Narayanam:
Hardware Efficient Approximate Multiplier Architecture for Image Processing Applications. 217-230
Volume 38, Number 3, June 2022
- Vishwani D. Agrawal:
Editorial. 231 - Test Technology Newsletter. 233-234
- Wendong Wang, Adit D. Singh, Ujjwal Guin:
A Systematic Bit Selection Method for Robust SRAM PUFs. 235-246 - Kamran Zahid:
The Detection of Malicious Modifications in the FPGA. 247-260 - Trevor Kroeger, Wei Cheng, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi:
Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFs. 261-277 - Yindong Xiao, Yutong Zeng, Qiong Wu, Ke Liu, Yanjun Li, Chong Hu:
Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoost. 279-288 - Bahman Arasteh, Parisa Imanzadeh, Keyvan Arasteh, Farhad Soleimanian Gharehchopogh, Bagher Zarei:
A Source-code Aware Method for Software Mutation Testing Using Artificial Bee Colony Algorithm. 289-302 - Junchi Ma, Zongtao Duan, Lei Tang:
Deep Soft Error Propagation Modeling Using Graph Attention Network. 303-319 - Brett Sparkman, Scott C. Smith, Jia Di:
Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage Parallelism. 321-334
Volume 38, Number 4, August 2022
- Vishwani D. Agrawal:
Editorial. 335-336 - The Newsletter of the Test Technology Technical Council of the IEEE Computer Society. 337-338
- Yang Sun, Spencer K. Millican:
Applying Artificial Neural Networks to Logic Built-in Self-test: Improving Test Point Insertion. 339-352 - Parthibaraj Anguraj, Krishnan Thiruvenkadam, Saravanan Subramanian:
CMOS Implementation and Performance Analysis of Known Approximate 4: 2 Compressors. 353-370 - D. Tilak Raju, Y. Srinivasa Rao:
Efficient Design of Rounding Based Static Segment Imprecise Multipliers for Error Tolerance Application. 371-379 - Chinthalgiri Jyothi, Saranya Karunamurthi, Bhaskara Rao Jammu, Sreehari Veeramachaneni, Sk. Noor Mahammad:
A New Approximate 4-2 Compressor using Merged Sum and Carry. 381-394 - Mohammed Moness, Lamya Gaber, Aziza I. Hussein, Hanafy M. Ali:
Automated Design Error Debugging of Digital VLSI Circuits. 395-417 - Leila Dehbozorgi, Reza Sabbaghi-Nadooshan, Alireza Kashaninia:
Novel Fault-Tolerant Processing in Memory Cell in Ternary Quantum-Dot Cellular Automata. 419-444 - Ishak Parlar, Mehmet Nuri Almali:
Experimental and Simulation Results of Wien Bridge Oscillator Circuıt Realized wıth Op-Amp Designed Using a Memristor. 445-452 - Syed Usman Amin, Muhammad Aaquib Shahbaz, Syed Arsalan Jawed, Fahd Khan, Muhammad Junaid, Danish Kaleem, Musaddiq Siddiq, Zain Hussain Warsi, Naveed:
Temperature and Humidity Controlled Test Bench for Temperature Sensor Characterization. 453-461
Volume 38, Number 5, October 2022
- Vishwani D. Agrawal:
Editorial. 463-464 - 2021 JETTA-TTTC Best Paper Award. 465-467
- Test Technology Newsletter. 469-470
- Janani Varun, R. A. Karthika:
Achieving Agility in Projects Through Hierarchical Divisive Clustering Algorithm. 471-479 - V. Udaya Sankar, Gayathri Lakshmi, Y. Siva Sankar:
A Review of Various Defects in PCB. 481-491 - Sushil Doranga, Jenny Zhou, Ram Poudel:
Influence of Printed Circuit Board Dynamics on the Fretting Wear of Electronic Connectors: A Dynamic Analysis Approach. 493-510 - Zhi-Wei Lai, Po-Hua Huang, Kuen-Jong Lee:
Using both Stable and Unstable SRAM Bits for the Physical Unclonable Function. 511-525 - Yadi Zhong, Ayush Jain, M. Tanjidur Rahman, Navid Asadizanjani, Jiafeng Xie, Ujjwal Guin:
AFIA: ATPG-Guided Fault Injection Attack on Secure Logic Locking. 527-546 - S. Deepanjali, Sk. Noor Mahammad:
Self Healing Controllers to Mitigate SEU in the Control Path of FPGA Based System: A Complete Intrinsic Evolutionary Approach. 547-565 - E. Jagadeeswara Rao, K. Tarakeswara Rao, K. Sudha Ramya, D. Ajaykumar, R. Trinadh:
Efficient Design of Rounding-Based Approximate Multiplier Using Modified Karatsuba Algorithm. 567-574
Volume 38, Number 6, December 2022
- Vishwani D. Agrawal:
Editorial. 575 - Test Technology Newsletter. 577
- Neha Pannu, Neelam Rup Prakash, Jasbir Kaur:
Effect of Sizing and Scaling on Power Dissipation and Resilience of an RHBD SRAM Circuit. 579-587 - Jean de Dieu Nguimfack-Ndongmo, Kevin Kentsa Zana, Derek Ajesam Asoh, Adelaïde Nicole Kengnou Telem, René Kuaté-Fochie, Godpromesse Kenné:
Development of a Simplified Programming Kit Based 16LF18856 for Embedded Systems Testing and Education in Developing Countries. 589-602 - Natalia Lylina, Chih-Hao Wang, Hans-Joachim Wunderlich:
A Complete Design-for-Test Scheme for Reconfigurable Scan Networks. 603-621 - S. S. Vinod Chandra, S. Saju Sankar, Hareendran S. Anand:
Smell Detection Agent Optimization Approach to Path Generation in Automated Software Testing. 623-636 - Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, Srivaths Ravi, Degang Chen:
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing. 637-651 - Naveenkumar R, N. M. Sivamangai, Napolean A, S. Sridevi Sathya Priya:
Design and Evaluation of XOR Arbiter Physical Unclonable Function and its Implementation on FPGA in Hardware Security Applications. 653-666 - Richa Sharma, G. K. Sharma, Manisha Pattanaik:
A CatBoost Based Approach to Detect Label Flipping Poisoning Attack in Hardware Trojan Detection Systems. 667-682
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