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Haralampos-G. D. Stratigopoulos
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2020 – today
- 2024
- [j38]Wenzhe Guo
, Kuilian Yang
, Haralampos-G. Stratigopoulos
, Hassan Aboushady
, Khaled Nabil Salama
:
An End-To-End Neuromorphic Radio Classification System With an Efficient Sigma-Delta-Based Spike Encoding Scheme. IEEE Trans. Artif. Intell. 5(4): 1869-1881 (2024) - [c80]Hassan Aboushady, Noemie Beringuier-Boher, Kelly Burke, Philippe Dallemagne
, Mario De Biase, Manuel Di Frangia, Virginie Deniau, Enrico Ferrari, Christophe Gaquière, Dominique Morche, Fabio Patrone, Stefano Pesci, Luigi Pomante, Andries Stam, Vincenzo Stornelli, Haralampos-G. Stratigopoulos, Mottaqiallah Taouil, Emmanuel Vaumorin, Jonathan Villain, Sander Steeghs:
Trusted SMEs for Sustainable Growth of Europeans Economical Backbone to Strengthen the Digital Sovereignty: The KDT Resilient Trust Project. DSD 2024: 620-627 - [c79]Alán Rodrigo Díaz Rizo, Abdelrahman Emad Abdelazim, Hassan Aboushady, Haralampos-G. Stratigopoulos:
Covert Communication Channels Based On Hardware Trojans: Open-Source Dataset and AI-Based Detection. HOST 2024: 101-106 - [c78]A. Sayed, Michel Vasilevski, M. T. Abdelmomen, Shadi Turk, Ahmed A. Ghoniem, C. Perez, C. Voillequin, Haralampos-G. Stratigopoulos, Marie-Minerve Louërat, E. Wantiez, Hassan Aboushady:
A 10.8GS/s, 84MHz-BW RF Bandpass ΣΔ ADC with a 89dB-SFDR and a 62dB-SNDR for LTE/5G Receivers. VLSI Technology and Circuits 2024: 1-2 - [c77]N. Afroz, A. Sayem, Georgios Volanis, Dzmitry Maliuk, Haralampos-G. Stratigopoulos, Yiorgos Makris:
On the Sensitivity of Analog Artificial Neural Network Models to Process Variation. VTS 2024: 1-7 - [i1]Theofilos Spyrou, Said Hamdioui, Haralampos-G. Stratigopoulos:
SpikeFI: A Fault Injection Framework for Spiking Neural Networks. CoRR abs/2412.06795 (2024) - 2023
- [j37]Fei Su
, Chunsheng Liu
, Haralampos-G. Stratigopoulos
:
Special Issue on Testability and Dependability of Artificial Intelligence Hardware. IEEE Des. Test 40(2): 5-7 (2023) - [j36]Fei Su
, Chunsheng Liu
, Haralampos-G. Stratigopoulos
:
Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and Perspectives. IEEE Des. Test 40(2): 8-58 (2023) - [j35]Sarah A. El-Sayed, Theofilos Spyrou
, Luis A. Camuñas-Mesa
, Haralampos-G. Stratigopoulos
:
Compact Functional Testing for Neuromorphic Computing Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(7): 2391-2403 (2023) - [j34]Alán Rodrigo Díaz Rizo
, Hassan Aboushady
, Haralampos-G. Stratigopoulos
:
Anti-Piracy Design of RF Transceivers. IEEE Trans. Circuits Syst. I Regul. Pap. 70(1): 492-505 (2023) - [j33]Alán Rodrigo Díaz Rizo
, Hassan Aboushady
, Haralampos-G. Stratigopoulos
:
Leaking Wireless ICs via Hardware Trojan-Infected Synchronization. IEEE Trans. Dependable Secur. Comput. 20(5): 3845-3859 (2023) - [c76]Haralampos-G. Stratigopoulos, Theofilos Spyrou, Spyridon Raptis:
Testing and Reliability of Spiking Neural Networks: A Review of the State-of-the-Art. DFT 2023: 1-8 - [c75]Theofilos Spyrou, Haralampos-G. Stratigopoulos:
On-Line Testing of Neuromorphic Hardware. ETS 2023: 1-6 - 2022
- [j32]Julian Leonhard, Nimisha Limaye
, Shadi Turk
, Alhassan Sayed
, Alán Rodrigo Díaz Rizo
, Hassan Aboushady
, Ozgur Sinanoglu
, Haralampos-G. Stratigopoulos
:
Digitally Assisted Mixed-Signal Circuit Security. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(8): 2449-2462 (2022) - [j31]Mohamed Elshamy
, Giorgio Di Natale
, Alhassan Sayed
, Antonios Pavlidis
, Marie-Minerve Louërat
, Hassan Aboushady
, Haralampos-G. Stratigopoulos
:
Digital-to-Analog Hardware Trojan Attacks. IEEE Trans. Circuits Syst. I Regul. Pap. 69(2): 573-586 (2022) - [j30]Alán Rodrigo Díaz Rizo
, Julian Leonhard, Hassan Aboushady
, Haralampos-G. Stratigopoulos
:
RF Transceiver Security Against Piracy Attacks. IEEE Trans. Circuits Syst. II Express Briefs 69(7): 3169-3173 (2022) - [c74]Mariam Tlili, Alhassan Sayed, Doaa Mahmoud, Marie-Minerve Louërat, Hassan Aboushady
, Haralampos-G. Stratigopoulos:
Anti-Piracy of Analog and Mixed-Signal Circuits in FD-SOI. ASP-DAC 2022: 423-428 - [c73]Theofilos Spyrou, Sarah A. El-Sayed, Engin Afacan, Luis A. Camuñas-Mesa, Bernabé Linares-Barranco, Haralampos-G. Stratigopoulos:
Reliability Analysis of a Spiking Neural Network Hardware Accelerator. DATE 2022: 370-375 - [c72]Alán Rodrigo Díaz Rizo, Hassan Aboushady
, Haralampos-G. Stratigopoulos:
SyncLock: RF Transceiver Security Using Synchronization Locking. DATE 2022: 1153-1156 - [c71]Michele Portolan, Antonios Pavlidis, Giorgio Di Natale, Eric Faehn, Haralampos-G. Stratigopoulos:
Circuit-to-Circuit Attacks in SoCs via Trojan-Infected IEEE 1687 Test Infrastructure. ITC 2022: 539-543 - [c70]Antonios Pavlidis, Eric Faehn, Marie-Minerve Louërat, Haralampos-G. Stratigopoulos:
Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs. VTS 2022: 1-8 - 2021
- [j29]Julian Leonhard, Alhassan Sayed
, Marie-Minerve Louërat
, Hassan Aboushady
, Haralampos-G. D. Stratigopoulos
:
Analog and Mixed-Signal IC Security via Sizing Camouflaging. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(5): 822-835 (2021) - [j28]Antonios Pavlidis
, Marie-Minerve Louërat
, Eric Faehn, Anand Kumar
, Haralampos-G. Stratigopoulos
:
SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety. IEEE Trans. Circuits Syst. I Regul. Pap. 68(6): 2580-2593 (2021) - [j27]Mohamed Elshamy
, Alhassan Sayed
, Marie-Minerve Louërat
, Hassan Aboushady
, Haralampos-G. Stratigopoulos
:
Locking by Untuning: A Lock-Less Approach for Analog and Mixed-Signal IC Security. IEEE Trans. Very Large Scale Integr. Syst. 29(12): 2130-2142 (2021) - [c69]Julian Leonhard, Mohamed Elshamy, Marie-Minerve Louërat, Haralampos-G. D. Stratigopoulos:
Breaking Analog Biasing Locking Techniques via Re-Synthesis. ASP-DAC 2021: 555-560 - [c68]Theofilos Spyrou, Sarah A. El-Sayed, Engin Afacan, Luis A. Camuñas-Mesa, Bernabé Linares-Barranco, Haralampos-G. Stratigopoulos:
Neuron Fault Tolerance in Spiking Neural Networks. DATE 2021: 743-748 - [c67]Antonios Pavlidis, Eric Faehn, Marie-Minerve Louërat, Haralampos-G. Stratigopoulos:
BIST-Assisted Analog Fault Diagnosis. ETS 2021: 1-6 - [c66]Mohamed Elshamy, Haralampos-G. Stratigopoulos:
Neuron-PUF: Physical Unclonable Function Based on a Single Spiking Neuron. IOLTS 2021: 1-6 - 2020
- [c65]Mohamed Elshamy, Alhassan Sayed, Marie-Minerve Louërat, Amine Rhouni, Hassan Aboushady
, Haralampos-G. D. Stratigopoulos:
Securing Programmable Analog ICs Against Piracy. DATE 2020: 61-66 - [c64]Antonios Pavlidis, Marie-Minerve Louërat, Eric Faehn, Anand Kumar, Haralampos-G. D. Stratigopoulos:
Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP. DATE 2020: 282-285 - [c63]Mohamed Elshamy, Giorgio Di Natale, Antonios Pavlidis, Marie-Minerve Louërat, Haralampos-G. D. Stratigopoulos:
Hardware Trojan Attacks in Analog/Mixed-Signal ICs via the Test Access Mechanism. ETS 2020: 1-6 - [c62]Sarah A. El-Sayed, Theofilos Spyrou, Antonios Pavlidis, Engin Afacan, Luis A. Camuñas-Mesa, Bernabé Linares-Barranco, Haralampos-G. D. Stratigopoulos:
Spiking Neuron Hardware-Level Fault Modeling. IOLTS 2020: 1-4
2010 – 2019
- 2019
- [c61]Julian Leonhard, Muhammad Yasin
, Shadi Turk, Mohammed Thari Nabeel, Marie-Minerve Louërat, Roselyne Chotin-Avot, Hassan Aboushady, Ozgur Sinanoglu
, Haralampos-G. D. Stratigopoulos:
MixLock: Securing Mixed-Signal Circuits via Logic Locking. DATE 2019: 84-89 - [c60]Sarah A. El-Sayed, Luis A. Camuñas-Mesa, Bernabé Linares-Barranco, Haralampos-G. D. Stratigopoulos:
Self-Testing Analog Spiking Neuron Circuit. SMACD 2019: 81-84 - [c59]Julian Leonhard, Marie-Minerve Louërat, Hassan Aboushady, Ozgur Sinanoglu
, Haralampos-G. D. Stratigopoulos:
Mixed-Signal Hardware Security Using MixLock: Demonstration in an Audio Application. SMACD 2019: 185-188 - [c58]Ghada Sokar, Yassin Zakaria
, Asmaa Rabie, Kareem Madkour, Ira Leventhal, Jochen Rivoir, Xinli Gu, Haralampos-G. D. Stratigopoulos:
IP Session on Machine Learning Applications in IC Test-Related Tasks. VTS 2019: 1 - 2018
- [j26]Haralampos-G. D. Stratigopoulos, Christian Streitwieser:
Adaptive Test With Test Escape Estimation for Mixed-Signal ICs. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(10): 2125-2138 (2018) - [c57]Haralampos-G. D. Stratigopoulos:
Machine learning applications in IC testing. ETS 2018: 1-10 - [c56]Naohiko Shimizu, Junichi Akita, Marie-Minerve Louërat, Haralampos-G. D. Stratigopoulos, Jean-Paul Chaput, Dimitri Galayko:
Open Source Hardware and EDA Tools for Analog/Mixed-Signal Design and Prototyping. ISCAS 2018: 1-5 - [c55]Yiorgos Makris
, Amit Nahar, Haralampos-G. D. Stratigopoulos, Marc Hutner:
Special session on machine learning: How will machine learning transform test? VTS 2018: 1 - 2017
- [j25]Maria K. Michael, Haralampos-G. D. Stratigopoulos:
Recap of the European Test Symposium 2017 (ETS'17). IEEE Des. Test 34(6): 119-120 (2017) - [j24]Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris
:
Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(12): 2120-2133 (2017) - [c54]Maria K. Michael, Rolf Drechsler
, Stephan Eggersglüß, Haralampos-G. D. Stratigopoulos, Sybille Hellebrand, Rob Aitken:
Foreword. ETS 2017: 1-2 - [c53]Haralampos-G. D. Stratigopoulos, Christian Streitwieser:
Adaptive test flow for mixed-signal ICs. VTS 2017: 1-6 - 2016
- [j23]Nicola Nicolici, Haralampos-G. D. Stratigopoulos:
Guest Editors' Introduction: Top Papers from the 2015 International Test Conference. IEEE Des. Test 33(6): 5-6 (2016) - [j22]Manuel J. Barragán, Haralampos-G. D. Stratigopoulos, Salvador Mir, Hervé Le Gall, Neha Bhargava, Ankur Bal:
Practical Simulation Flow for Evaluating Analog/Mixed-Signal Test Techniques. IEEE Des. Test 33(6): 46-54 (2016) - [j21]Guillaume Renaud, Manuel J. Barragán, Asma Laraba, Haralampos-G. D. Stratigopoulos, Salvador Mir, Hervé Le Gall, Hervé Naudet:
A 65nm CMOS Ramp Generator Design and its Application Towards a BIST Implementation of the Reduced-Code Static Linearity Test Technique for Pipeline ADCs. J. Electron. Test. 32(4): 407-421 (2016) - [j20]Manuel J. Barragán
, Rshdee Alhakim, Haralampos-G. D. Stratigopoulos
, Matthieu Dubois, Salvador Mir, Hervé Le Gall, Neha Bhargava, Ankur Bal:
A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio ΣΔ ADC. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(11): 1876-1888 (2016) - [j19]Martin Andraud
, Haralampos-G. D. Stratigopoulos, Emmanuel Simeu:
One-Shot Non-Intrusive Calibration Against Process Variations for Analog/RF Circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 63-I(11): 2022-2035 (2016) - [c52]Athanasios Dimakos, Haralampos-G. D. Stratigopoulos, Alexandre Siligaris, Salvador Mir, Emeric de Foucauld:
Built-in test of millimeter-Wave circuits based on non-intrusive sensors. DATE 2016: 505-510 - [c51]Said Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos:
ETS 2016 foreword. ETS 2016: 1 - [c50]Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
:
Harnessing fabrication process signature for predicting yield across designs. ISCAS 2016: 898-901 - 2015
- [j18]Athanasios Dimakos, Haralampos-G. D. Stratigopoulos, Alexandre Siligaris, Salvador Mir, Emeric de Foucauld:
Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors. J. Electron. Test. 31(4): 381-394 (2015) - [j17]Asma Laraba, Haralampos-G. D. Stratigopoulos, Salvador Mir, Hervé Naudet:
Exploiting Pipeline ADC Properties for a Reduced-Code Linearity Test Technique. IEEE Trans. Circuits Syst. I Regul. Pap. 62-I(10): 2391-2400 (2015) - [c49]John Liaperdos, Haralampos-G. D. Stratigopoulos, Louay Abdallah, Yiorgos Tsiatouhas, Angela Arapoyanni, Xin Li:
Fast deployment of alternate analog test using Bayesian model fusion. DATE 2015: 1030-1035 - [c48]Hervé Le Gall, Rshdee Alhakim, Miroslav Valka, Salvador Mir, Haralampos-G. D. Stratigopoulos, Emmanuel Simeu:
High frequency jitter estimator for SoCs. ETS 2015: 1-6 - [c47]Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris
:
Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion. ICCAD 2015: 9-14 - [c46]Athanasios Dimakos, Martin Andraud
, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Emmanuel Simeu, Salvador Mir:
Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors. ISVLSI 2015: 627 - [c45]Haralampos-G. D. Stratigopoulos, Manuel J. Barragán, Salvador Mir, Hervé Le Gall, Neha Bhargava, Ankur Bal:
Evaluation of low-cost mixed-signal test techniques for circuits with long simulation times. ITC 2015: 1-7 - 2014
- [j16]Haralampos-G. D. Stratigopoulos, Stephen Sunter:
Fast Monte Carlo-Based Estimation of Analog Parametric Test Metrics. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 33(12): 1977-1990 (2014) - [c44]Martin Andraud
, Haralampos-G. D. Stratigopoulos, Emmanuel Simeu:
One-Shot Calibration of RF Circuits Based on Non-Intrusive Sensors. DAC 2014: 10:1-10:2 - [c43]Ayssar Serhan
, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir:
Low-cost EVM built-in test of RF transceivers. IDT 2014: 51-54 - [c42]Martin Andraud
, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard
, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier
, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos:
Solutions for the self-adaptation of communicating systems in operation. IOLTS 2014: 234-239 - [c41]Josep Altet
, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà
, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès
, Xavier Jordà
, Miquel Vellvehí
, Stefan Dilhaire, Salvador Mir, Diego Mateo
:
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes. MWSCAS 2014: 1081-1084 - [c40]Matthieu Dubois, Haralampos-G. D. Stratigopoulos, Salvador Mir, Manuel J. Barragán:
Evaluation of digital ternary stimuli for dynamic test of ΣΔ ADCs. VLSI-SoC 2014: 1-6 - [c39]Matthieu Dubois, Haralampos-G. D. Stratigopoulos, Salvador Mir, Manuel J. Barragán:
Statistical Evaluation of Digital Techniques for $\sum\varDelta$ ADC BIST. VLSI-SoC (Selected Papers) 2014: 129-148 - [c38]Haralampos-G. D. Stratigopoulos, Stephen Sunter:
Efficient Monte Carlo-based analog parametric fault modelling. VTS 2014: 1-6 - 2013
- [j15]Asma Laraba, Haralampos-G. D. Stratigopoulos, Salvador Mir, Hervé Naudet, Gerard Bret:
Reduced-Code Linearity Testing of Pipeline ADCs. IEEE Des. Test 30(6): 80-88 (2013) - [c37]Haralampos-G. D. Stratigopoulos, Pierre Faubet, Yoann Courant, Firas Mohamed:
Multidimensional analog test metrics estimation using extreme value theory and statistical blockade. DAC 2013: 72:1-72:7 - [c36]Ke Huang, Haralampos-G. D. Stratigopoulos, Louay Abdallah, Salvador Mir, Ahcène Bounceur:
Multivariate statistical techniques for analog parametric test metrics estimation. DTIS 2013: 6-11 - [c35]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir:
True non-intrusive sensors for RF built-in test. ITC 2013: 1-10 - [c34]Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir:
Fault modeling and diagnosis for nanometric analog circuits. ITC 2013: 1-10 - [c33]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet
:
Defect-oriented non-intrusive RF test using on-chip temperature sensors. VTS 2013: 1-6 - [c32]Asma Laraba, Haralampos-G. D. Stratigopoulos, Salvador Mir, Hervé Naudet, Gerard Bret:
Reduced code linearity testing of pipeline adcs in the presence of noise. VTS 2013: 1-6 - 2012
- [j14]Haralampos-G. D. Stratigopoulos, Salvador Mir:
Adaptive Alternate Analog Test. IEEE Des. Test Comput. 29(4): 71-79 (2012) - [j13]Haralampos-G. D. Stratigopoulos, Alberto Valdes-Garcia:
Guest Editors' Introduction: Digitally Enhanced Wireless Transceivers. IEEE Des. Test Comput. 29(6): 5-6 (2012) - [j12]Haralampos-G. D. Stratigopoulos:
Test Metrics Model for Analog Test Development. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(7): 1116-1128 (2012) - [j11]Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir, Camelia Hora, Yizi Xing, Bram Kruseman:
Diagnosis of Local Spot Defects in Analog Circuits. IEEE Trans. Instrum. Meas. 61(10): 2701-2712 (2012) - [c31]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet:
Testing RF circuits with true non-intrusive built-in sensors. DATE 2012: 1090-1095 - [c30]Dimitri de Jonghe, Elie Maricau, Georges G. E. Gielen, Trent McConaghy, Bratislav Tasic, Haralampos-G. D. Stratigopoulos:
Advances in variation-aware modeling, verification, and testing of analog ICs. DATE 2012: 1615-1620 - [c29]Asma Laraba, Haralampos-G. D. Stratigopoulos, Salvador Mir, Hervé Naudet, Christophe Forel:
Enhanced reduced code linearity test technique for multi-bit/stage pipeline ADCs. ETS 2012: 1-6 - [c28]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma:
Experiences with non-intrusive sensors for RF built-in test. ITC 2012: 1-8 - 2011
- [j10]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma:
RF Front-End Test Using Built-in Sensors. IEEE Des. Test Comput. 28(6): 76-84 (2011) - [j9]Haralampos-G. D. Stratigopoulos, Krishnendu Chakrabarty
:
Guest Editorial. J. Electron. Test. 27(3): 223 (2011) - [j8]Ahcène Bounceur, Salvador Mir, Haralampos-G. D. Stratigopoulos:
Estimation of Analog Parametric Test Metrics Using Copulas. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30(9): 1400-1410 (2011) - [c27]Alexios Spyronasios, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir:
On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study. Asian Test Symposium 2011: 365-370 - [c26]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir:
Implicit test of high-speed analog circuits using non-intrusive sensors. ECCTD 2011: 652 - [c25]Nathan Kupp, Haralampos-G. D. Stratigopoulos, Petros Drineas
, Yiorgos Makris
:
On proving the efficiency of alternative RF tests. ICCAD 2011: 762-767 - 2010
- [j7]Haralampos-G. D. Stratigopoulos, Petros Drineas
, Mustapha Slamani, Yiorgos Makris
:
RF Specification Test Compaction Using Learning Machines. IEEE Trans. Very Large Scale Integr. Syst. 18(6): 998-1002 (2010) - [c24]Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir:
Bayesian Fault Diagnosis of RF Circuits Using Nonparametric Density Estimation. Asian Test Symposium 2010: 295-298 - [c23]Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir:
Fault diagnosis of analog circuits based on machine learning. DATE 2010: 1761-1766 - [c22]Louay Abdallah, Haralampos-G. D. Stratigopoulos, Christophe Kelma, Salvador Mir:
Sensors for built-in alternate RF test. ETS 2010: 49-54 - [c21]Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev:
Defect filter for alternate RF test. ETS 2010: 265-270 - [c20]Haralampos-G. D. Stratigopoulos, Salvador Mir:
Analog test metrics estimates with PPM accuracy. ICCAD 2010: 241-247 - [c19]Dzmitry Maliuk, Haralampos-G. D. Stratigopoulos, Yiorgos Makris
:
An analog VLSI multilayer perceptron and its application towards built-in self-test in analog circuits. IOLTS 2010: 71-76 - [c18]Dzmitry Maliuk, Haralampos-G. D. Stratigopoulos, He Huang, Yiorgos Makris
:
Analog neural network design for RF built-in self-test. ITC 2010: 684-693 - [c17]Salvador Mir, Haralampos-G. D. Stratigopoulos, Ahcène Bounceur:
Density estimation for analog/RF test problem solving. VTS 2010: 41 - [c16]Haralampos-G. D. Stratigopoulos:
Special session 4C: Thesis research poster session. VTS 2010: 131 - [c15]Haralampos-G. D. Stratigopoulos:
Special session 8A: TTTC 2010 E. J. McCluskey Best Doctoral Thesis Award. VTS 2010: 257 - [c14]Haralampos-G. D. Stratigopoulos:
Special session 12A: Panel adaptive analog test: Feasibility and opportunities ahead. VTS 2010: 353
2000 – 2009
- 2009
- [j6]Haralampos-G. D. Stratigopoulos, Salvador Mir, Ahcène Bounceur:
Evaluation of Analog/RF Test Measurements at the Design Stage. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 28(4): 582-590 (2009) - [c13]Haralampos-G. D. Stratigopoulos, Salvador Mir, Yiorgos Makris
:
Enrichment of limited training sets in machine-learning-based analog/RF test. DATE 2009: 1668-1673 - [c12]Haralampos-G. D. Stratigopoulos, Salvador Mir, Erkan Acar, Sule Ozev:
Defect Filter for Alternate RF Test. ETS 2009: 101-106 - [c11]Matthieu Dubois, Haralampos-G. D. Stratigopoulos, Salvador Mir:
Hierarchical parametric test metrics estimation: A ΣΔ converter BIST case study. ICCD 2009: 78-83 - [c10]Yiorgos Makris
, Haralampos-G. D. Stratigopoulos:
Special Session 7C: TTTC 2009 Best Doctoral Thesis Contest. VTS 2009: 233 - 2008
- [j5]Haralampos-G. D. Stratigopoulos, Yiorgos Makris
:
Error Moderation in Low-Cost Machine-Learning-Based Analog/RF Testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(2): 339-351 (2008) - [c9]Haralampos-G. D. Stratigopoulos, Jeanne Tongbong, Salvador Mir:
A General Method to Evaluate RF BIST Techniques Based on Non-parametric Density Estimation. DATE 2008: 68-73 - [c8]James Dardig, Haralampos-G. D. Stratigopoulos, Eric Stern, Mark A. Reed
, Yiorgos Makris
:
A Statistical Approach to Characterizing and Testing Functionalized Nanowires. VTS 2008: 267-274 - 2007
- [c7]Haralampos-G. D. Stratigopoulos, Petros Drineas
, Mustapha Slamani, Yiorgos Makris
:
Non-RF to RF Test Correlation Using Learning Machines: A Case Study. VTS 2007: 9-14 - 2006
- [j4]Haralampos-G. D. Stratigopoulos, Yiorgos Makris
:
An adaptive checker for the fully differential analog code. IEEE J. Solid State Circuits 41(6): 1421-1429 (2006) - [j3]Haralampos-G. D. Stratigopoulos, Yiorgos Makris
:
Concurrent detection of erroneous responses in linear analog circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(5): 878-891 (2006) - [c6]Haralampos-G. D. Stratigopoulos, Yiorgos Makris
:
Bridging the Accuracy of Functional and Machine-Learning-Based Mixed-Signal Testing. VTS 2006: 406-411 - 2005
- [j2]Haralampos-G. D. Stratigopoulos, Yiorgos Makris
:
Nonlinear decision boundaries for testing analog circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 24(11): 1760-1773 (2005) - [c5]Haralampos-G. D. Stratigopoulos, Yiorgos Makris
:
Generating decision regions in analog measurement spaces. ACM Great Lakes Symposium on VLSI 2005: 88-91 - [c4]Haralampos-G. D. Stratigopoulos, Yiorgos Makris
:
Constructive Derivation of Analog Specification Test Criteria. VTS 2005: 395-400 - 2004
- [j1]Haralampos-G. D. Stratigopoulos, Yiorgos Makris
:
An Analog Checker with Input-Relative Tolerance for Duplicate Signals. J. Electron. Test. 20(5): 479-488 (2004) - 2003
- [c3]Haralampos-G. D. Stratigopoulos, Yiorgos Makris
:
An Analog Checker With Input-Relative Tolerance for Duplicate Signals. IOLTS 2003: 54- - [c2]Haralampos-G. D. Stratigopoulos, Yiorgos Makris:
Concurrent Error Detection in Linear Analog Circuits Using State Estimation. ITC 2003: 1164-1173 - [c1]Haralampos-G. D. Stratigopoulos, Yiorgos Makris
:
An Analog Checker with Dynamically Adjustable Error Threshold for Fully Differential Circuits. VTS 2003: 209-218
Coauthor Index

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