"Multi-Step Stress Test for Yield Improvement of 16Mbit EPROMs with ..."

J. Miyamoto et al. (1991)

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DOI: 10.1109/TEST.1991.519716

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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J. Miyamoto, N. Ohtsuka, K. Imamiya, N. Tomita, Y. Iyama:
Multi-Step Stress Test for Yield Improvement of 16Mbit EPROMs with Redundancy Scheme. ITC 1991: 540-547

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