"An analytical threshold voltage model of NMOSFETs with hot-carrier induced ..."

Ching-Sung Ho et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.10.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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Ching-Sung Ho, Kuo-Yin Huang, Ming Tang, Juin J. Liou:
An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect. Microelectron. Reliab. 45(7-8): 1144-1149 (2005)

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